2. Specification
Specification
Model
Parts
Specification
HL402-BW
Optional observation method
Brightfield/oblique illumination/polarized light/DIC/transmitted light
O
Optical system
Infinity Chromatic Aberration Correction Optical System
·
Observation tube
30° tilt, hinged trinocular observation tube, beam splitting ratio R:T=100:0 or 50:50
·
Eyepiece
High eye point large field plan eyepiece PL10X/22mm
·
High eye point large field plan eyepiece PL10X/22mm (adjustable diopter, with micrometer)
O
High eye point large field plan eyepiece PL15X/16mm
O
Infinity long distance plan achromatic objective
LMPL 5X /0.15 DIC WD10.8mm
·
LMPL 10X/0.3 DIC WD12.2mm
·
LMPL 20X/0.45 DIC WD4mm
·
LMPL 50X/0.55 WD7.9mm
·
LMPL 100X/0.80 WD2.1mm
O
Converter
5-Hole Tilt Converter with DIC Slot
·
Focusing mechanism
Coaxial coarse and fine adjustment, coarse adjustment stroke 33mm, fine adjustment accuracy 0.001mm, with coarse adjustment mechanism upper limit and elastic adjustment device. Built-in 100-240V wide voltage transformer, dual power output
·
Stage
4" double-layer mechanical mobile platform, platform area 230X215mm, travel 105x 105mm, with glass platform, right-hand X, Y mobile handwheel, with platform interface
·
Reflective Lighting System
With variable field diaphragm and aperture diaphragm, the center can be adjusted; with color filter slot and polarizer slot; with oblique illumination switch lever. Single high-power 5W LED, white, continuously adjustable light intensity.
·
Transillumination system
Single high-power 5W LED, white, continuously adjustable light intensity. N.A.0.5 condenser with variable aperture diaphragm
·
Other acessories
Polarizer board, fixed analyzer board, 360°rotating analyzer board
·
Interference filter set for reflection
·
DIC Differential Interference Component
O
Software
FMIA2021 genuine metallographic analysis software, Sony chip 12 million camera device, 0.5X adapter mirror interface, micrometer.
·
Note: "·" is standard configuration; "O" is optional
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